接上一次记录,芯片的初始形态,是圆形的晶圆(wafer),如下图:
将圆形变成方形,肯定就意味着损失 —— 为了减小损失,就要缩小芯片的尺寸,在这里对应着工艺:
The cost of an integrated circuit rises quickly as the die size increases, due both to the lower yield and to the fewer dies that fit on a wafer. To reduce the cost, using the next generation process shrinks a large die as it uses smaller sizes for both transistors and wires. This improves the yield and the die count per wafer. A 32-nanometer (nm) process was typical in 2012, which means essentially that the smallest feature size on the die is 32nm.
这带来的结果是几个公式:
第一个是数学逻辑,定义性质的了;第二个是近似,因为还是有边缘上的损失;第三个是经验公式,因此成本与芯片面积并不是线性关系:
Hence, depending on the defect rate and the size of the die and wafer, costs are generally not linear in the die area.
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