1270

2022-03-29

1. 长期重现性：δ值 vs. 分析次数（时间）

2. 真空度：液氮冷阱

3. 能量窗~滤波

4. 狭缝~MRP

5. 计数率 ~ 基体

6. FC和EM的相对增益校正：Cameca built-in amplifier calibration routine

7. Isobaric interference：correction of isobaric interference could not be resolved directly → peak stripping 

8. 老化效应对EM产率的影响

9. Sputtering time: sputtering effects - intensity(cps) vs. time(sec) → sputtering equilibrium →pre-sputterig time + transfer deflectors centering time = total pre-sputtering time

10. 基体效应：measurement~true(conventional method)